Please use this identifier to cite or link to this item:
https://repository.iimb.ac.in/handle/123456789/4932
Title: | Lee shopping experience : Gauging customer satisfaction; Arvind | Authors: | Shreeram, M Venkata | Keywords: | Mystery shopping exercise;Customer interviews;Staff's knowledge, products;Customer satisfaction;Purchase experience;Customer benchmarking;Brand outlets;Jeans segment | Issue Date: | 2003 | Publisher: | Indian Institute of Management Bangalore | Series/Report no.: | PGP-Summer Project Report;SP.PGP.P3-113 | URI: | http://repository.iimb.ac.in/handle/123456789/4932 |
Appears in Collections: | 2003 |
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P3-113.pdf | 8.71 MB | Adobe PDF | View/Open Request a copy |
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